Separation algorithm for bulk lifetime and surface recombination velocity of thick silicon wafers and bricks via time-resolved photoluminescence decay

Abstract

We present a method to simultaneously determine bulk and surface recombination properties using time-resolved photoluminescence (PL) decay. The lifetime separation algorithm makes use of the analytical expression of the asymptotic separation of two time-resolved PL decays corresponding to different excitation wavelengths as well as that of the ratio of two steady-state PL intensities excited by the two different wavelengths. Detailed experimental methods of measuring these two terms are presented and the effect of signal-to-noise ratio is discussed to determine the applicability of this algorithm.