Sensitivity analysis of the two-thickness and two-layer methods for material parameter extraction using a single waveguide probe

Abstract

A full-wave solution for material parameter extraction which uses two independent measurements is presented. When the addition of random noise on the measurements is considered, the estimates of the propagation of those errors greatly reduces the confidence in the two-layer results. Future work shall investigate the two-layer method using different thicknesses and types of material for the top layer.