Sensitivity Analysis of a Linearizing Controller for the Fed-Batch Baker's Yeast Fermentation

Abstract

Feedback linearizing control of the fed-batch baker's yeast fermentation process is studied. Special attention is devoted to the tuning of the linearizing controller with respect to errors in the yield YX/S and the influent substrate concentration CS,in. If the controller timing does not incorporate possible errors in YX/S and CS/in, the performance of the controller, defined as the deviation from the setpoint of the specific growth rate, decreases considerably. This is illustrated by experimental data and by simulations. A sensitivity analysis with respect to errors in YX/S and CS,in, indicates that better performance can be obtained if the uncertainty on these parameters is taken into account. This is also validated with an experiment and by simulation.