Abstract

Photonic crystal waveguide for refractive index sensing is investigated. Plane wave expansion method, which is fast and suitable for analyzing periodic structures, is used to estimate the functionality for refractive index sensing. Dispersion diagram is obtained to quantify transmittance and to determine the cut-off wavelength, which shifts for a small change in refractive index in the voids. It has been proposed that ring-type line defect photonic crystal waveguide has relatively better sensitivity for sensing applications as compared to the conventional line defect waveguide.

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