Abstract
We have implemented interference imaging mode as well as Lorentz imaging mode on a scanning transmission electron microscope (HITACHI HF-2000 with a scanning option; 200 kV accelerating voltage). In the interference mode, a pair of mutually coherent fine probes scan simultaneously across the region of magnetic induction. By monitoring the relative phase change occurring in the probe pair, the variation of the magnetic flux bound by the probe trajectories can be sensed by the universal unit of e/h (−‖e‖: electron charge and h: Planck’s constant). The combined use of this imaging mode with the Lorentz mode which is based on the detection of the probe deflection by Lorentz force facilitates detailed analyses of fringing field around magnetic materials and magnetic induction inside magnetic films. The microscope described above is particularly suited for the study of magnetic storage devices whose microscopic magnetic properties are drawing much attention recently. We show here the results of its application to the observation of field distributions near the MR (magnetoresistive) heads and induction distributions associated with high density longitudinal and perpendicular recording media.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
