Abstract

Semi-supervised learning aims to utilize unlabeled data in the process of supervised learning. In particular, combining semi-supervised learning with dimension reduction can reduce overfitting caused by small sample size in high dimensional data. By graph representation with similarity edge weights among data samples including both labeled and unlabeled data, statistical and geometric-structures in data are utilized to explore clustering structure of a small number of labeled data samples. However, most of semi-supervised dimension reduction methods use the information induced from unlabeled data points to modify only within-class scatter of labeled data, since unlabeled data can not give any information about distance between classes. In this paper, we propose semi-supervised dimension reduction which reinforce-between-class distance by using a penalty graph and minimize within-class scatter by using a similarity graph. We apply our approach to extend linear dimension reduction methods such as linear discriminant analysis (LDA) and maximum margin criterion (MMC) and demonstrate that modifying between-class distance as well can make great impacts on classification performance.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.