Semiquantitative X-ray diffraction method for phase analysis using additions of a foreign component

Abstract

A method is described for semiquantitative X-ray diffraction phase analysis, which involves the addition to the investigated multicomponent system of known large (about 80–95%) amounts of a crystalline substance originally not contained in the system. This results in a decrease of the diffraction line intensities of the components to be measured to small but detectable values. The weight fraction of a component is related to the added fraction of the doping substance and to the fraction of that component remaining in the doped sample. The method is very simple and yields the weight fractions of the major components in the system with a typical error of a few percent. The weight fractions of the minor components cannot be determined with fair accuracy in this way. The method is appropriate in cases where only a small amount of the investigated system is available. Optimum conditions to attain maximum accuracy of the method are discussed.