Abstract

An analytic expression is obtained for the threshold of a semiconductor laser in the form of a five-layer structure with separate electron and optical confinement. An analysis is made of the dependence of the lasing threshold on the thickness of the active and waveguide layers, and also on the permittivities of these layers.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call