Abstract
To realize scale quantum processors, the surface-electrode ion trap is an effective scaling approach, including single-layer, double-layer, and quasi-double-layer traps. To calculate critical trap parameters such as the trap center and trap depth, the finite element method (FEM) simulation was widely used, however, it is always time consuming. Moreover, the FEM simulation is also incapable of exhibiting the direct relationship between the geometry dimension and these parameters. To eliminate the problems above, House and Madsen et al. have respectively provided analytic models for single-layer traps and double-layer traps. In this paper, we propose a semi-analytical model for quasi-double-layer traps. This model can be applied to calculate the important parameters above of the ion trap in the trap design process. With this model, we can quickly and precisely find the optimum geometry design for trap electrodes in various cases.
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