Abstract
ABSTRACTSemi-coherent Y2O3 (yttria) inclusions have been observed in high quality, c-axis oriented YBa2Cu3O6+×,(YBCO) Alms. The inclusions were studied by transmission electron microscopy (TEM), and were found to be embedded in the YBCO matrix without disturbing its structure seriously. Their number density is estimated to higher than 2 × 1016 cm−3 in epitaxial YBCO films, having transport critical current densities in excess of 1 × 106 A cm−2 at 77 K. Magnetization measurements indicate a possible correlation between a high density of yttria inclusions and high pinning strength. The effects of the inclusions on film growth and microstructure is discussed.
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