Abstract
Defects in CdTe generated by micro-indentation are studied by cathodoluminescence scanning microscopy. At low temperatures ( T < 100 K) a localized luminescence with peak energy at 1.48 eV is observed. A model for the dislocation distribution on ±(111), (110) and (100) surfaces is presented. By analyzing the dislocation rosettes on these surfaces the defect bound luminescence can be related to Te(g) dislocations. The polarity of the glide dislocations is established by studying the depth distribution of Te(g) dislocations on ()Te oriented samples.
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