Abstract
This paper addresses the problem of generating deterministic test patterns via a cost-efficient self-test circuitry. The proposed solution is based on primitive linear feedback shift registers (LFSR) and a mapping of their outputs on the inputs of the circuit under test. By construction, an exhaustive enumeration of all LFSR states ensures a complete stuck-at fault coverage. For the computation of the mapping function two approaches will be discussed that are based on an tuned ATPG algorithm or alternatively on a given deterministic test pattern set. Experimental data with over 30 benchmark circuits underline the efficiency of these approaches; with only a few exceptions a LFSR of length 20 is sufficient to guarantee complete fault coverage.
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