Abstract
A slowly-varying-envelope photonic sampling method is proposed for hyperfine and ultra-wideband frequency response measurement of high-speed photodetectors (PDs). The measuring frequency range of PD is firstly divided into several segments by the repetition frequency <i>f</i><sub>r</sub> of a mode-locked laser diode (MLLD), and the hyperfine frequency response measurement of the PD in every segment is then achieved by applying a slowly-varying-envelope microwave modulation sweeping up to <i>f</i><sub>r</sub>/2, which is also independent of the uneven responses of the MLLD and the Mach-Zehnder modulator (MZM). Finally, through carefully choosing the joint-frequency of photonic sampling, the ultra-wideband frequency response of the PD can be obtained with the help of seamlessly stitching different segments. Most importantly, the frequency response of the PD at any frequency can be measured by subtly changing the frequency of photonic sampling from DC to <i>f</i><sub>r</sub>/2. Moreover, the measuring frequency range of the PD can be extended by 2(<i>n</i>+1)-fold relative to the modulation frequency range of the MZM, where the microwave frequency swept up to fr/2 enables the measuring frequency range up to (<i>n</i>+1)<i>f</i><sub>r</sub>.
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