Abstract
We report detailed characterization of in-situ wired single wall carbon nanotube (SWNT) field effect transistors (FETs). They were batch processed using a single step technique based on hot filament chemical vapor deposition. Raw samples show an ambipolar field effect. The temperature dependence of the gain confirms the presence of Schottky barriers at the nanotube/metal interface. Moreover the gate dependence exhibits hysteresis at any temperature due to extraction and trapping of charges. Below 30 K, Coulomb blockade occurs at low drain-source bias and partially washes out the influence of the Schottky barriers.
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