Abstract
Built-in self-test (BIST) is emerging as an important option for testing VLSI application-specific integrated circuits (ASICs). The advantages of BIST are reviewed in relation to the particular test requirements imposed by ASICs. A suite of programs will be described that facilitate the incorporation of BIST into ASIC designs. The programs comprise a high-level planning tool, operating from functional descriptions of the circuit. A set of programs will also be described that enable the evaluation of the fault coverage achieved when circuits are tested using pseudorandom patterns, and also aid the placement of additional test hardware to improve the level of fault coverage.
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