Abstract

The effects of helium ion irradiation on the graphite surface are studied by employing a plasma focus device. The device emits helium ion pulse having energies in the range of a few keV to a few MeV and flux on the order of 1025 m−2 s−1 at 60 mm axial position from the anode tip. The field emission scanning electron microscopy confirms the formation of multi-modal spherical and elongated agglomerated structures on irradiated samples surface with increase in agglomerate size with increasing number of irradiation shots. The transient annealing in each irradiation was not enough to cause the Oswald ripening or sintering of particles into bigger particle or crystal size but only resulted in clustering. The atomic force micrographs reveal an increase in average surface roughness with increasing ion irradiation. The Raman study demonstrates increase in disordered D peak along with reduced crystallite size (La) with increasing number of irradiation shots.

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