Self-organized criticality in manufacturing system unscheduled downtime series and its application to major failure prediction

Abstract

In this study, self-organized criticality theory was applied to analyze the unscheduled downtime (USDT) characteristic of a complex manufacturing system. The long-range correlation of the USDT series was verified through the Hurst exponent value. Then, we developed a model to depict the relationship between the frequency and USDT duration with the extreme value theory. The parameters of the model were estimated with the maximum likelihood method and updated with Bayesian inference when new data was available. Finally, the effectiveness of the proposed method was validated by the USDT data of the bottleneck system from a semiconductor assembly and test factory.