Abstract
The properties of Josephson devices are strongly affected by geometrical effects such as those associated with the magnetic field induced by the bias current. The generally adopted analysis of Owen and Scalapino (1967 Phys. Rev. 164, 538) for the critical current, Ic, of an in-line Josephson tunnel junction in the presence of an in-plane external magnetic field, He, is revisited and extended to junctions whose electrodes can be thin and of different materials, i.e., of arbitrary penetration depth. We demonstrate that the asymmetry of the magnetic diffraction pattern, Ic(He), is ascribed to the different electrode inductances, for which we provide empirical expressions. We also generalize the modeling to the window-type junctions used nowadays and discuss how to take advantage of the asymmetric behavior in the realization of some superconducting devices. Further we report a systematic investigation of the diffraction patterns of in-line window-type junctions having a number of diverse geometrical configurations and made of dissimilar materials. The experimental results are found to be in agreement with the predictions and clearly demonstrate that the pattern asymmetry increases with the difference in the electrode inductances.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.