Abstract

We develop a device model for p-i-n tunneling transit-time diodes based on graphene single- and multiple-layer structures operating at the reverse bias voltages. The model of the graphene tunneling transit-time diode (GTUNNETT) accounts for the features of the interband tunneling generation of electrons and holes and their ballistic transport in the device i-section, as well as the effect of the self-consistent electric field associated with the self-consistent charges of propagating electrons and holes. Using the developed model, we calculate the dc current-voltage characteristics and the ac frequency-dependent admittance as functions of the GTUNNETT structural parameters, in particular, the number of graphene layers.

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