Self-checking binary logic systems using ternary logic circuits

Abstract

The present status of multivalued logic is highlighted in a Canadian context. A particular example is given of the use of ternary circuits in the solution of the problem of testability of binary logic, through the introduction of a new concept called 2-of-3-valued logic. Its application to the design of combinational and sequential self-checking systems is demonstrated. Topics discussed include: multivalued logic, testability, reliability, ternary logic, CMOS logic, and fault tolerance.