Abstract
We present a self-calibrating scheme for microscopes using model-based wavefront sensorless adaptive optics. Unlike previous methods, this scheme permits the calibration of system aberration modes without the need for a separate wavefront sensor or interferometer. Basis modes are derived from the deformable mirror influence functions and an image cross-correlation method is used to remove image displacement eff ects from these modes. Image based measurements are used to derive an optimum modal representation from the displacement-free basis modes. These new modes are insensitive to system misalignments and the shape of the illumination pro file. We demonstrate the effectiveness and robustness of these optimal modes in a third harmonic generation (THG) microscope.
Highlights
Aberrations frequently affect the performance of high resolution microscopes
We demonstrate this scheme in an adaptive third harmonic generation (THG) microscope and show its effectiveness in the presence of system misalignments
The method presented in this paper permits the calibration of an adaptive optical microscope without the need for an additional wavefront sensor or interferometer to characterise the adaptive element
Summary
Aberrations frequently affect the performance of high resolution microscopes. In order to overcome this problem, adaptive optics (AO) techniques have been introduced in a range of different microscope modalities. Modal methods of sensorless AO provide an efficient method of indirect wavefront measurement, but require careful calibration of the adaptive element to function effectively, when using a DM; this calibration encodes the control signals that generate aberration modes from a suitable basis set, such as the Zernike polynomials For this reason, systems have incorporated interferometers or wavefront sensors, which required increased complexity in the overall optical design and operation. We propose a fully empirical determination of aberration modes that can be implemented in any optical microscope and does not require a wave front sensor We demonstrate this scheme in an adaptive third harmonic generation (THG) microscope and show its effectiveness in the presence of system misalignments
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