Abstract
Atomic force microscopy (AFM) is widely used for structural characterization of 2D materials. We report here on the appearance of linear pseudo-structures of subnanometer height (‘nanotracks’), observed in AFM images of 2D-nanoparticles of graphene, MoS2, WS2, BN, synthesized by the mechanochemical technique and deposited from dispersions on the mica surface. It is stated that the nanotracks appear as a result of nanoparticle displacement on the surface under the influence of the AFM tip during scanning. The appearance of the nanotracks is caused by a high relative concentration of monolayer nanoparticles in the prepared dispersions; their bulk aggregation; subsequent destruction of the aggregates by the AFM probe with formation of the nanoparticles weakly bound to the substrate. A method is proposed how to distinguish monolithic particles from granulated aggregates, as well as a technique to prevent their displacement during measurements. The possibility is considered of using AFM to develop effective nanolubricants and provide their precise nanoscale deposition on the specified surface areas.
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