Abstract

Single-wall carbon nanotubes were synthesized on specified parts of oxidized silicon substrates by single acetylene burst CVD and studied with high-resolution scanning electron and scanning probe micro-scopes. The resistance of individual nanotubes and nanotube series was measured using devices fabricated by the deposition of Pd and Pd/Al electrodes on the obtained single-wall nanotubes. The contact potential difference between Pd electrodes and carbon nanotubes was measured in the Kelvin mode of a scanning probe microscope.

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