Abstract
We report here the use of molecular beam epitaxy (MBE) to achieve selective-area epitaxy (SAE) and coalescence of CdTe on nanopatterned substrates with 0.5-μm-pitch arrays of CdTe/ZnTe/Si(211) seeding areas, exposed through a silicon nitride mask. The nanopatterned substrate surface morphology, crystallinity, and chemical composition were characterized by scanning electron microscopy (SEM), x-ray diffraction (XRD), and x-ray photoelectron spectroscopy (XPS) both before and after exposure to CdTe flux by MBE. We find a seven times wider (422) CdTe XRD rocking curve full-width at half-maximum (FWHM) for our patterned samples, when directly compared with unpatterned samples with identical growth and pregrowth conditions. We also observe that electron beam-induced carbon deposits can serve as a mask material for SAE of CdTe by MBE. Finally, we point to possible further improvements in patterned sample architectures of the future, for use in CdTe films on Si.
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