Abstract
The conductive and field emission properties of individual single and multi-walled carbon nanotubes, grown by chemical vapour and supercritical fluid deposition techniques, have been assessed using an in-situ transmission electron microscope-scanning tunnelling microscope (TEM-STM) technique. The conductivity and field emission measurements were obtained from nanotube-electrode distance and contact observations. Experimental field emission characteristics for all carbon nanotubes investigated fitted well to the Fowler-Nordheim equation when different work functions were applied. Differences in field emission and conductive properties are analysed and related to the structure of the carbon nanotubes. The method presented here is suitable for in situ selection of CNT with desired properties for particular electronic applications.
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