Abstract
A population of 572 F2 derived F3 lines from six crosses were used to estimate parameters relevant to selection for resistance to Septoria nodorum of wheat. Lines were grown in disease free (fungicide sprayed) and inoculated microplots in 2 replications of a split-plot design in a single environment in 1977. Average yield reduction due to disease was approximately 50%; this was associated with an average septoria score of 50% on the flag leaf, an average septoria score of 42% on the head, and a reduction of 37% in seed weight. Low S. nodorum scores were correlated with late heading date, tall plant height, high grain yield, and high seed weight in diseased plots, and high seed weight % (seed weight in diseased plots expressed as a percentage of seed weight in fungicide sprayed plots).
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
