Abstract
The seismic refraction survey is a very important geophysical technique used in the investigation of subsurface characteristics. This is why this study was carried out to emphasize the ability of the seismic refraction method in determining the thickness of stratified layers of soil and rock. The results obtained are generalized expressions that relate travel time, offset distance, velocity and thickness of subsurface layers.
Highlights
The seismic refraction method is one geophysical technique which is frequently used to determine the characteristics of soils and rocks (Ugwu, 2008; Ayolabi et al, 2009)
The seismic refraction survey is a very important geophysical technique used in the investigation of subsurface characteristics
The seismic refraction method is based on the measurement of the travel time of seismic waves refracted at the interfaces between subsurface layers of different velocity (Ayolabi et al, 2009)
Summary
The seismic refraction method is one geophysical technique which is frequently used to determine the characteristics of soils and rocks (Ugwu, 2008; Ayolabi et al, 2009). After a certain distance from the shot point, known as the cross over distance, the refracted signal is observed as a first arrival signal at the geophones (arriving before the direct arrival). Both compressional waves (P-waves) which provide depth information of interfaces and Shear waves (S-waves) which provide additional data about engineering properties of the subsurface media can be used in the seismic refraction method (Ayolabi et al, 2009; Igboekwe and Ohaegbuchu, 2011; Gabr et al, 2012). This study will obtain the mathematical expression relating time of arrival of the waves, distance between source and geophones, velocity and depth of various layers
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