Abstract
The distribution of interstitials, such as carbon and boron, in commercial-purity and high-purity (zone-refined) single crystals of NiAl has been characterized in the atom-probe field-ion microscope. These interstitials were found to form ultrafine precipitates containing refractory metals. The estimated precipitate number density in the commercial-purity single crystal was observed to be at least an order of magnitude higher than the high-purity crystal. The increase in yield stress as a result of this precipitation was predicted using the Orowan relationship for precipitation strengthening and compared to existing data.
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