Abstract
A highly resistant germplasm ICGV86699 and a highly susceptible cultivar Zhonghua 5 were used as parents to build a recombined inbred lines population( XA- RILs). The genetic characteristics of resistance to late leaf spot( LLS) in peanut were studied based on the segregation analysis of genetic system of quantitative traits.The results showed that LLS resistance among XA- RILs was significantly different and the resistance was controlled by two additive- epistatic major genes and additive- epistatic polygenes. The heritabilities of main genes were 60. 10%- 86. 61% while the heritabilities of polygenes were 6. 65%- 32. 77%. The correlation analysis verified that resistance to LLS was linked with some poor agronomic traits such as late maturity,low yield and small seed. From XA- RILs,an elite line,XA006,was selected as a breeding line possessing high yield and resistance to LLS with other desirable agronomical traits.
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