Abstract
The growth process of a latent segregated microstructure called the CP (chrysanthemumlike pattern) has been investigated as a function of film thickness in sputtered Co-21.5 at.% Cr films. As film growth proceeds, each crystallite exhibits CP structure development with a periodical stripe pattern. Only crystallites with Cr-rich cores survive. This is related to Cr segregation at the grain boundaries. The CP structure growth process is explained using a model based on (1) a phase separation process restricted by grain boundary and surface diffusion, and (2) grain boundary Cr enrichment at the latter stage of segregation. The correlation between CP structure growth and the change in magnetic properties strongly indicates that the perpendicularly formed CP structure is responsible for the magnetic properties of Co-Cr films. >
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
