Abstract
Abstract Material throughput measurement is important for many applications, for example yield maps creation or control of mass flow in stationary lines. Quite perspective can be the capacitive throughput method. Segmented capacitance sensor (SCS) is discussed in this paper. SCS is a compromise between simple capacitive throughput sensors and electrical capacitance tomography sensors. The SCS variant with partially released inactive segments is presented. The mathematical model of SCS was created and verified by measurements. A good correspondence between measured and computed values was found and it can be stated that the proposed mathematical model was verified. During measurement the voltage values on the inactive segments were monitored as well. On the basis of the measurement there was found that these values are significantly influenced by material distribution.
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