Abstract
Resistive Switching In article number 2300060, and colleagues have successfully grown AlN layers on both N-polar and Al-polar seed crystals using a Cu–Al–Ca solution system. The authors compared the surface morphologies by stereoscopic microscopy and optical microscope, growth rates by Cross-sectional SEM images, growth qualities by HRXRD, Raman and PL for the Al-polar and N-polar surfaces.
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