Section 3.3 - Yield Loci Based on Crystallographic Texture

Abstract

This chapter presents methods that are suitable for deriving the yield locus of a polycrystalline material from a physical measurement of its crystallographictexture. In principle, these methods are limited to single-phase materials in annealed condition, with equiaxed grains sufficiently small as to neglect material heterogeneity at the scale at which one wants to use the yield locus. Strain rate sensitivity is supposed to be positive or negative but small enough in absolute value. Methods described in the present chapter have almost exclusively been applied to fcc, bcc, and hcp metals, although in principle they could be used with any type of ductile polycrystalline material. Typical applications are anisotropic finite element (FE)-based simulations of metal-forming processes, mainly sheet metal forming but also rolling and wire drawing. The purpose of such FE simulations is to predict the final shape and dimensions of the product, forming limits (failure), spring-back and/or residual stress, final texture, and final grain size.