Second-generation scanning photoemission microscope at the National Synchrotron Light Source

Abstract

We are commissioning a new generation scanning photoemission microscope (X1-SPEM II) at beamline X1A of the National Synchrotron Light Source (NSLS). Our first generation scanning photoemission microscope (X1-SPEM I) was the first to achieve submicron resolution. One of the major improvements is the replacement of the home-made single pass cylindrical mirror analyzer with a high energy resolution, multi-channel Hemispherical Sector Analyzer (HSA). The alignment scheme for the optical elements has also been redesigned. The advantages of these two major improvements will be discussed.A photoemission microscope requires a high brightness source and a good focusing scheme. In most cases, a monochromator is placed between the photon source and the focusing optical elements. Our X1-SPEM uses the soft x-ray undulator at the NSLS as a high brightness source. A Fresnel zone plate is coherently illuminated by the monochromatic beam selected by the spherical grating monochromator (250-800 eV range) to form a microprobe, less then 0.2 μm in size.