Secondary photoelectron spectra of ionic solids as a function of the incident photon energy

Abstract

Energy distributions of slow electrons (0–10 eV) emitted by thin layers of NaCl, KBr, CsBr, and CsI irradiated by monochromatic XUV photons with various energies in the interval of 50–300 eV are measured. The contributions of slow secondaries, hot secondaries and primary photoelectrons are obtained. It is shown that the higher the absorption coefficient for incident photons, the stronger the contribution of hot secondaries. The relationship between their contribution and the electron—phonon scattering process is discussed.