Abstract
The beam-matter interaction results in a multitude of secondary particles. These particles bear information useful for analytical method and the potential for applications through their controlled generation. The knowledge of their emission physics results in technological options for the control of their properties. The production of secondary ions, electrons, photons, neutrons, and exotic particles will be discussed based on relevant application examples and connections to future chapters. In particular, neutron and photon sources based on accelerated induced secondary particle physics already have numerous applications. Different source options will be discussed together with layout optimisations.
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