Abstract
A highly sensitive surface analytical technique, secondary ion mass spectroscopy (SIMS), is introduced to study organic surfaces. Using Langmuir—Blodgett films of arachidic acid as model systems, it is shown that the chemical composition of the surface can be studied with a depth resolution of about 10 Å. It is shown that by varying the subphase concentration of the weakly binding Mg 2+ ion, the surface concentration of Cd assumes a maximum for a constant bulk concentration of Cd 2+. This correlates with the maximum packing density of the solid monolayer on the water surface, as measured by film balance experiments. The magnitude of the effect suggests a cooperativity between structural changes and ion binding.
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