Abstract
Abstract An overview of secondary ion mass spectrometry (SIMS) is given. It is placed in context of other surface analytical techniques. The SIMS technique is divided into static, dynamic, and imaging SIMS. The basic operations, assumptions, and variations are explained with examples from the scientific literature. Problems associated with interpreting the collected data and the ways in which the data is interpreted are given. The recommendations from ASTM and ISO in the use of SIMS and interpretation of the data are referenced.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
