Abstract
Secondary ion mass spectra recorded on sputtering individual particles of occupational dust emitted by nuclear plants carry information about the chemical composition of the microsamples. Along with the data of isotopic analysis, the data of secondary ion mass spectrometry enables one to judge the function of the materials and the character of processes occurred at the plant. The efficiency of the procedure is demonstrated by the results of analyses of real samples selected by inspectors of the International Atomic Energy Agency at plants with nuclear fuel cycle
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