Abstract
We have measured the secondary electron emission statistics (ES) for 5 keV Nq+ (q = 1–4) ions incident at 10° on polycrystalline aluminium, in coincidence with specularly reflected N0. In this arrangement the kinetic contribution to secondary electron emission is minimised. The experimental data shows that the coincident electron yield, γ, increases linearly with incident ion charge state. The kinetic emission contribution has also been determined from this data. The ES due to 2 and 4 keV He2+ impact on polycrystalline aluminium in coincidence with specularly reflected He+ and He0 have also been determined. The process He2+ → He0 yields a larger γ value than the process He2+ → He+.
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