Abstract
The secondary electron emission yields from clean copper surfaces induced at normal incidence of low energy (2.4–125 eV/amu) rare gas ions have been measured in an ultra high vacuum chamber (~10-11 Torr). It has been found that the yields increase with the ionic charge of the incident ions over the whole impact energy range investigated. It was also found that the kinetic emission was independent of the incident ion charge. As a further result, the potential emissions measured in the present study are smaller than those previously measured as well as those expected by some scaling laws.
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