Abstract
Experimental studies have been made on the secondary electron emission yields from metal surfaces bombarded by H10, H1+, and H20 with energies ranging by 10 to 40 KeV. The yields increase with the incident beam energy. The yield from H10 is smaller than that by H1+ and is proportional to the cosecant of the incidence angle. The yield by H20 is larger by a factor of two than that by H10 with the same velocity. The mechanism of the secondary electron emission is discussed by comparing the yield by H10 with that by H1+ and by considering the observed angular dependence. The observed difference in the yields by H10 and H1+ is considered to originate essentially from the difference between the ionization cross-sections of the two particles within the shallow layer below the surface. A neutral particle detector has been made on the basis of the angular dependence results.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
