Abstract
Secondary electrom emission yield (δ) and the surface work function values (φ) were measured for lead zirconium titanate (PZT) doped with lanthanum, strontium, and niobium. The single pulse method was used in LEED/Auger geometry for measuring the secondary electron emission yield δ while the retarding potential technique was employed for measuring the work function. In view of the application of ceramics as continuous dynodes in electron multipliers, the secondary electron emission and electical conductivity data is analysed for reduced PLZT ceramics. Maximum δ of 2.7 was found to remain unchanged after reduction of PLZT. Dionne's equation was used as a basis for analysis of secondary electron emission measurements to estimate escape depth and emission probability.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
