Abstract
The total secondary electron emission yield from the entrance and exit surfaces of thin aluminium foils has been measured for protons, deuterons and He beams in the MeV region. It is found that this yield for each surface decreases with the ion beam intensity and with the dose; the former may be due to a beam-induced temperature effect while the latter is attributed to an increase of the beam-induced contamination from adsorbed gases in the target. The ratio of total forward yield to the total backward yield is about a factor of 2 which is also observed to be approximately the ratio of the contamination rates of the exit surface to the entrance surface. This suggests the possibility that the secondary electron emission is directly related to the surface contamination rate.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
