Abstract
The secondary electron emission (SEE) properties of sulfur-incorporated nanocomposite carbon (n-C) films were studied. Maximum SEE yield (δmax) values obtained ranged from 3.27 to 6.98, which are between those for graphite (δmax ~ 1) and high purity diamond films in their as-grown condition (δmax ~ 9), and are consistent with the composite nature of the films. It was found that δmax values of n-C films are mostly determined by the atomic oxygen concentration on the surface of the films, which appears to control the probability of escape of the secondary electrons from the surface of the films, as inferred by employing Ascarelli’s model for SEE (J Appl Phys 89:689, 2001). Also, mean escape depth values for the secondary electrons were obtained using this model, and their significance as bulk parameters for the films is discussed.
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