Abstract
The characteristics of secondary electron emission from a glass surface by Ar/sup +/ ions were investigated experimertally. The yields from glass and quartz microsheets were larger than those from stainless steel. It was first observed that field-enhanced emission and seif-sustained emission were caused by the surface charge. Because increasing of the yield has technological demand, HF etching and sandblast were attempted as one of the means of increasing yield. Then the yields of etched and sandblasted samples were about two times larger than that of nonetched or nonsandblasted sample. Field-enhanced emission and seif-sustained emission cannot be irterpreted only with kinetic ejection or potertial emission theory. A simple model is proposed in which the work function decreases by the band bending with the accumulation of positive charge near the surface. (auth)
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