Abstract
Using a dynamic sheath model, we have studied the secondary-electronemission effects at one-dimensional planar dielectric surface in plasmaimmersion ion implantation. The temporal evolution of the sheaththickness, the surface potential of dielectric, and the ions doseaccumulated on the dielectric surface are obtained. The numericalresults demonstrate that the charging effects are greatly enhanced by thesecondary electron emission effects, so the sheath thickness becomesthinner, the surface potential of dielectric decreases fast and theions dose accumulated on the dielectric surface significantlyincreases.
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