Abstract
We systematically investigate the second harmonic generated (SHG) signal created by metallic semi-continuous thin films as a function of the effective layer thickness for a large number of samples. The control of the film thickness allows us to precisely map the region around the percolation threshold. We obtain a sharp and intense SHG peak at the critical thickness where the near static permittivity diverges. This happens in the regime of almost touching particles while the thin film does not behave as a metal yet. This large SHG signal is obtained with samples fabricated using a thin film deposition technique that is easily wafer scalable.
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