Abstract
We use a scanning far-field optical second-harmonic microscope in reflection mode to image a gold film surface covered with randomly distributed scatterers. We recorded simultaneously images of the first (FH) and second harmonic (SH) signal in the wavelength range of 750–830 nm for different densities of scatterers. The SH images showed localized enhancement (∼103 the background) in the form of small (∼0.7μm) round bright spots that exhibited both wavelength and polarization dependences in their brightness. We concluded that the overall behaviour of the observed phenomenon is related to the overlap of FH and SH eigenmodes. (© 2003 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
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