Abstract
Pure and doped nanocrystalline ZnO films of 0.1–1.0 μm thickness were prepared by spray pyrolysis techniques. Structural properties of these thin films were investigated by electron microscopy, force microscopy, x-ray diffractometry, ellipsometry, and optical spectroscopy. Using Ti:sapphire laser pulses, the second-harmonic efficiency of the films was measured. A correlation between measured efficiency and the grain shape in the polycrystalline layers is reported. Moreover, measurements of the angular dependence of the second-harmonic intensity are indicative of the dominant role of bulk effects over surface effects for the second-harmonic generation in such films.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
